Physical principles of electron microscopy (Record no. 30991)
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000 -LEADER | |
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fixed length control field | 00416 a2200145 4500 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9780387258000 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 502.825 |
Item number | EGE |
090 ## - | |
-- | 1875 |
-- | 2202 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Egerton, Ray F. |
245 ## - TITLE STATEMENT | |
Title | Physical principles of electron microscopy |
Remainder of title | an introduction to TEM, SEM and AEM |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Place of publication, distribution, etc | New York |
Name of publisher, distributor, etc | Springer |
Date of publication, distribution, etc | 2005 |
Date of manufacture | 2005 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | ix,202p. |
Dimensions | 24cm |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | NATURAL SCIENCES AND MATHEMATICS |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Schedule Reference Materials |
Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Shelving location | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Cost, replacement price | Price effective from | Koha item type |
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Schedule Reference Collection | Main Library | Main Library | Reference Section | 28/07/2008 | 502.825EGE | 21497 | 30/08/2017 | 0.00 | 31/10/2016 | Schedule Reference Materials |