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Physical principles of electron microscopy

Egerton, Ray F.

Physical principles of electron microscopy an introduction to TEM, SEM and AEM - New York Springer 2005 - ix,202p. 24cm

ISBN: 9780387258000

Subjects--Topical Terms:
NATURAL SCIENCES AND MATHEMATICS

Dewey Class. No.: 502.825 / EGE

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Physical principles of electron microscopy