000 00385 a2200145 4500
020 _a0780310004
082 _a621.39732
_bSHA
090 _c5660
_d7639
100 _aSharma, Ashok K.
245 _aSemiconductor memories
_btechnology testing and reliability
260 _aNew York
_bJohn Willy
_c1997
_g1997
300 _axi,462p.
_c26cm
650 _aSEMICONDUCTOR MEMORY
942 _cSR
999 _c34517
_d34517