Chakraborty, Kanad <br/><br/>
Fault-tolerance and reliability techniques for high-density random acess memories 

 - New Delhi  Prentice hall  2002 
 - xix, 426p.  24cm. 
<br/><br/><label>ISBN: </label>8120322142 
<br/><br/><label>Subjects--Topical Terms: </label><br/>INTERNAL STORAGE
<br/><br/><label>Dewey Class. No.: </label>621.3973  / CHA