Sharma, Ashok K. <br/><br/>
Semiconductor memories   technology testing and reliability 

 - New York  John Willy  1997 
 - xi,462p.  26cm 
<br/><br/><label>ISBN: </label>0780310004 
<br/><br/><label>Subjects--Topical Terms: </label><br/>SEMICONDUCTOR MEMORY
<br/><br/><label>Dewey Class. No.: </label>621.39732  / SHA