TY  - GEN
AU  - Egerton, Ray F.
TI  - Physical principles of electron microscopy: an introduction to TEM, SEM and AEM 
SN  - 9780387258000
U1  - 502.825 
PY  - 2005///
CY  - New York
PB  - Springer
KW  - NATURAL SCIENCES AND MATHEMATICS
ER  -