Egerton, Ray F. <br/><br/>
Physical principles of electron microscopy  an introduction to TEM, SEM and AEM  

 - New York  Springer  2005 
 - ix,202p.  24cm 
<br/><br/><label>ISBN: </label>9780387258000 
<br/><br/><label>Subjects--Topical Terms: </label><br/>NATURAL SCIENCES AND MATHEMATICS
<br/><br/><label>Dewey Class. No.: </label>502.825  / EGE