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Semiconductor memories technology testing and reliability
Publication details: New Delhi Prentice-Hall 1997 1997Description: ix, 462p. 24cmISBN:- 8120316835
- 621.39732 SHA
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | |
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Main Library Lending Section | Lending Collection | 621.39732SHA (Browse shelf(Opens below)) | Available | 25209 | ||
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Lending Materials
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Main Library Lending Section | Lending Collection | 621.39732SHA (Browse shelf(Opens below)) | Available | 21312 |
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| 621.395WES Principles of CMOS VLSI design | 621.395WES Principles of CMOS VLSI design | 621.39732SHA Semiconductor memories | 621.39732SHA Semiconductor memories | 621.3973CHA Fault-tolerance and reliability techniques for high-density random acess memories | 621.3981BOL Programmable logic controllers | 621.398PEN Easy PC interfacing |
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