Wayamba University Library Network

Amazon cover image
Image from Amazon.com

Semiconductor memories technology testing and reliability

By: Publication details: New York John Willy 1997 1997Description: xi,462p. 26cmISBN:
  • 0780310004
Subject(s): DDC classification:
  • 621.39732 SHA
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Collection Call number Status Date due Barcode
Schedule Reference Materials Schedule Reference Materials Main Library Reference Section Schedule Reference Collection 621.39732SHA (Browse shelf(Opens below)) Available 12401

There are no comments on this title.

to post a comment.
Previous
Back to results
Next
Close
Share

All Rights Reserved, Main Library Wayamba University of Sri Lanka, Kuliyapitiya, Sri Lanka.
Telephone: +94-372283169, Fax: +94-372283169 - Email:library@wyb.ac.lk
Designed and Maintaining by EMCL Ekanayake
Last Updated:03-10-2024

Powered by Koha